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| Foreword | ||
| Preface | ||
| Ch. 1 | Introduction | 1 |
| Ch. 2 | Digital CMOS Fault Modeling and Inductive Fault Analysis | 15 |
| Ch. 3 | Defects in Logic Circuits and Their Test Implications | 65 |
| Ch. 4 | Testing Defects in Sequential Circuits | 95 |
| Ch. 5 | Defect Oriented RAM Testing and Current Testable RAMs | 133 |
| Ch. 6 | Testing Defects in Programmable Logic Circuits | 205 |
| Ch. 7 | Defect Oriented Analog Testing | 243 |
| Ch. 8 | Conclusion | 297 |
| Index | 305 |
| Price | Condition | Delivery | Seller | Action |
| $99.99 | Digital |
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Add Defect Oriented Testing for CMOS Analog and Digital Circuits, Defect oriented testing methods have come a long way from a mere interesting academic exercise to a hard industrial reality. Many factors have contributed to its industrial acceptance. Traditional approaches of testing modern integrated circuits (ICs) hav, Defect Oriented Testing for CMOS Analog and Digital Circuits to the inventory that you are selling on WonderClubX
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Add Defect Oriented Testing for CMOS Analog and Digital Circuits, Defect oriented testing methods have come a long way from a mere interesting academic exercise to a hard industrial reality. Many factors have contributed to its industrial acceptance. Traditional approaches of testing modern integrated circuits (ICs) hav, Defect Oriented Testing for CMOS Analog and Digital Circuits to your collection on WonderClub |