The average rating for Integrated Circuit Defect-Sensitivity based on 2 reviews is 3.5 stars.
Review # 1 was written on 2014-11-20 00:00:00 Anthony Vallant While a little dated, Rushton conveys not only good concurrent design principles, but proper usage and testbenching with VHDL. |
Review # 2 was written on 2018-10-23 00:00:00 Marie Davis I am not sure who the audience for this book is. The beginning chapters are obviously geared toward beginners, but the later chapters are quite complex - a remarkable range for a book under 400 pages. The book does a very poor job clearly explaining advanced topics. |
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