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Yield and Variability Optimization of Integrated Circuits Book

Yield and Variability Optimization of Integrated Circuits
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Yield and Variability Optimization of Integrated Circuits, Yield and Variability Optimization of Integrated Circuits deals with the primary and theoretical and practical aspects of IC statistical design and covers the most important issues of IC statistical design and the relevant mathematical framework. It descr, Yield and Variability Optimization of Integrated Circuits
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  • Yield and Variability Optimization of Integrated Circuits
  • Written by author J. C. Zhang, M. A. Styblinski
  • Published by Springer, 1995/02/28
  • Yield and Variability Optimization of Integrated Circuits deals with the primary and theoretical and practical aspects of IC statistical design and covers the most important issues of IC statistical design and the relevant mathematical framework. It descr
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List of Figures. Preface. 1. Introduction. 2. Overview of IC Statistical Modeling. 3. Design of Experiments. 4. Parametric Yield Maximization. 5. Variability Minimization and Tuning. 6. Worst-Case Measure Reduction. 7. Multi-Objective Circuit Optimization. A: Commonly Used Orthogonal Arrays. B: SPICE3 Input Decks. References. Index.


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Yield and Variability Optimization of Integrated Circuits, Yield and Variability Optimization of Integrated Circuits deals with the primary and theoretical and practical aspects of IC statistical design and covers the most important issues of IC statistical design and the relevant mathematical framework. It descr, Yield and Variability Optimization of Integrated Circuits

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Yield and Variability Optimization of Integrated Circuits, Yield and Variability Optimization of Integrated Circuits deals with the primary and theoretical and practical aspects of IC statistical design and covers the most important issues of IC statistical design and the relevant mathematical framework. It descr, Yield and Variability Optimization of Integrated Circuits

Yield and Variability Optimization of Integrated Circuits

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Yield and Variability Optimization of Integrated Circuits, Yield and Variability Optimization of Integrated Circuits deals with the primary and theoretical and practical aspects of IC statistical design and covers the most important issues of IC statistical design and the relevant mathematical framework. It descr, Yield and Variability Optimization of Integrated Circuits

Yield and Variability Optimization of Integrated Circuits

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