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Design for AT-Speed Test, Diagnosis and Measurement Book

Design for AT-Speed Test, Diagnosis and Measurement
Design for AT-Speed Test, Diagnosis and Measurement, Design for AT-Speed Test, Diagnosis and Measurement is the first book to offer practical and proven design-for-testability (DFT) solutions to chip and system design engineers, test engineers and product managers at the silicon level as well as at the boar, Design for AT-Speed Test, Diagnosis and Measurement has a rating of 3 stars
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Design for AT-Speed Test, Diagnosis and Measurement, Design for AT-Speed Test, Diagnosis and Measurement is the first book to offer practical and proven design-for-testability (DFT) solutions to chip and system design engineers, test engineers and product managers at the silicon level as well as at the boar, Design for AT-Speed Test, Diagnosis and Measurement
3 out of 5 stars based on 2 reviews
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  • Design for AT-Speed Test, Diagnosis and Measurement
  • Written by author Benoit Nadeau-Dostie
  • Published by Springer-Verlag New York, LLC, September 2007
  • Design for AT-Speed Test, Diagnosis and Measurement is the first book to offer practical and proven design-for-testability (DFT) solutions to chip and system design engineers, test engineers and product managers at the silicon level as well as at the boar
  • Design for AT-Speed Test, Diagnosis and Measurement is the first book to offer practical and proven design-for-testability (DFT) solutions to chip and system design engineers, test engineers and product managers at the silicon level as well as at t
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Foreword. Preface. 1. Technology Overview. 2. Memory Test and Diagnosis. 3. Logic Test and Diagnosis. 4. Embedded Test Design Flow. 5. Hierarchical Core Test. 6. Test and Measurement for PLLs and ADCs. 7. System Test and Diagnosis. 8. System Reuse of Embedded Test. Glossary. Index.


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Design for AT-Speed Test, Diagnosis and Measurement, Design for AT-Speed Test, Diagnosis and Measurement is the first book to offer practical and proven design-for-testability (DFT) solutions to chip and system design engineers, test engineers and product managers at the silicon level as well as at the boar, Design for AT-Speed Test, Diagnosis and Measurement

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Design for AT-Speed Test, Diagnosis and Measurement, Design for AT-Speed Test, Diagnosis and Measurement is the first book to offer practical and proven design-for-testability (DFT) solutions to chip and system design engineers, test engineers and product managers at the silicon level as well as at the boar, Design for AT-Speed Test, Diagnosis and Measurement

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Design for AT-Speed Test, Diagnosis and Measurement, Design for AT-Speed Test, Diagnosis and Measurement is the first book to offer practical and proven design-for-testability (DFT) solutions to chip and system design engineers, test engineers and product managers at the silicon level as well as at the boar, Design for AT-Speed Test, Diagnosis and Measurement

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