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Foreword. Preface. 1. Technology Overview. 2. Memory Test and Diagnosis. 3. Logic Test and Diagnosis. 4. Embedded Test Design Flow. 5. Hierarchical Core Test. 6. Test and Measurement for PLLs and ADCs. 7. System Test and Diagnosis. 8. System Reuse of Embedded Test. Glossary. Index.
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Add Design for AT-Speed Test, Diagnosis and Measurement, Design for AT-Speed Test, Diagnosis and Measurement is the first book to offer practical and proven design-for-testability (DFT) solutions to chip and system design engineers, test engineers and product managers at the silicon level as well as at the boar, Design for AT-Speed Test, Diagnosis and Measurement to the inventory that you are selling on WonderClubX
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Add Design for AT-Speed Test, Diagnosis and Measurement, Design for AT-Speed Test, Diagnosis and Measurement is the first book to offer practical and proven design-for-testability (DFT) solutions to chip and system design engineers, test engineers and product managers at the silicon level as well as at the boar, Design for AT-Speed Test, Diagnosis and Measurement to your collection on WonderClub |