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Preface | ||
About the Authors | ||
I | Introduction to Testing | 1 |
1 | Introduction | 3 |
2 | VLSI Testing Process and Test Equipment | 17 |
3 | Test Economics and Product Quality | 35 |
4 | Fault Modeling | 57 |
II | Test Methods | 81 |
5 | Logic and Fault Simulation | 83 |
6 | Testability Measures | 129 |
7 | Combinational Circuit Test Generation | 155 |
8 | Sequential Circuit Test Generation | 211 |
9 | Memory Test | 253 |
10 | DSP-Based Analog and Mixed-Signal Test | 309 |
11 | Model-Based Analog and Mixed-Signal Test | 385 |
12 | Delay Test | 417 |
13 | IDDQ Test | 439 |
III | Design and Testability | 463 |
14 | Digital DFT and Scan Design | 465 |
15 | Built-in Self-Test | 489 |
16 | Boundary Scan Standard | 549 |
17 | Analog Test Bus Standard | 575 |
18 | System Test and Core-Based Design | 595 |
19 | The Future of Testing | 613 |
A | Cyclic Redundancy Code Theory | 615 |
B | Primitive Polynomials of Degree 1 to 100 | 619 |
C | Books on Testing | 621 |
Bibliography | 631 | |
Index | 671 |
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Add Essentials of Electronic Testing for Digital, Memory, and Mixed-Signal VLSI Circuits, Today's electronic design and test engineers deal with several types of subsystems, namely, digital, memory, and mixed-signal, each requiring different test and design for testability methods. This book provides a careful selection of essential topics on , Essentials of Electronic Testing for Digital, Memory, and Mixed-Signal VLSI Circuits to the inventory that you are selling on WonderClubX
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Add Essentials of Electronic Testing for Digital, Memory, and Mixed-Signal VLSI Circuits, Today's electronic design and test engineers deal with several types of subsystems, namely, digital, memory, and mixed-signal, each requiring different test and design for testability methods. This book provides a careful selection of essential topics on , Essentials of Electronic Testing for Digital, Memory, and Mixed-Signal VLSI Circuits to your collection on WonderClub |