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Essentials of Electronic Testing for Digital, Memory, and Mixed-Signal VLSI Circuits Book

Essentials of Electronic Testing for Digital, Memory, and Mixed-Signal VLSI Circuits
Essentials of Electronic Testing for Digital, Memory, and Mixed-Signal VLSI Circuits, Today's electronic design and test engineers deal with several types of subsystems, namely, digital, memory, and mixed-signal, each requiring different test and design for testability methods. This book provides a careful selection of essential topics on , Essentials of Electronic Testing for Digital, Memory, and Mixed-Signal VLSI Circuits has a rating of 2 stars
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Essentials of Electronic Testing for Digital, Memory, and Mixed-Signal VLSI Circuits, Today's electronic design and test engineers deal with several types of subsystems, namely, digital, memory, and mixed-signal, each requiring different test and design for testability methods. This book provides a careful selection of essential topics on , Essentials of Electronic Testing for Digital, Memory, and Mixed-Signal VLSI Circuits
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  • Essentials of Electronic Testing for Digital, Memory, and Mixed-Signal VLSI Circuits
  • Written by author Michael L. Bushnell
  • Published by Springer-Verlag New York, LLC, November 2000
  • Today's electronic design and test engineers deal with several types of subsystems, namely, digital, memory, and mixed-signal, each requiring different test and design for testability methods. This book provides a careful selection of essential topics on
  • Today's electronic design and test engineers deal with several types of subsystems, namely, digital, memory, and mixed-signal, each requiring different test and design for testability methods. This book provides a careful selection of essential topics
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Book Categories

Authors

Preface
About the Authors
IIntroduction to Testing1
1Introduction3
2VLSI Testing Process and Test Equipment17
3Test Economics and Product Quality35
4Fault Modeling57
IITest Methods81
5Logic and Fault Simulation83
6Testability Measures129
7Combinational Circuit Test Generation155
8Sequential Circuit Test Generation211
9Memory Test253
10DSP-Based Analog and Mixed-Signal Test309
11Model-Based Analog and Mixed-Signal Test385
12Delay Test417
13IDDQ Test439
IIIDesign and Testability463
14Digital DFT and Scan Design465
15Built-in Self-Test489
16Boundary Scan Standard549
17Analog Test Bus Standard575
18System Test and Core-Based Design595
19The Future of Testing613
ACyclic Redundancy Code Theory615
BPrimitive Polynomials of Degree 1 to 100619
CBooks on Testing621
Bibliography631
Index671


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Essentials of Electronic Testing for Digital, Memory, and Mixed-Signal VLSI Circuits, Today's electronic design and test engineers deal with several types of subsystems, namely, digital, memory, and mixed-signal, each requiring different test and design for testability methods. This book provides a careful selection of essential topics on , Essentials of Electronic Testing for Digital, Memory, and Mixed-Signal VLSI Circuits

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Essentials of Electronic Testing for Digital, Memory, and Mixed-Signal VLSI Circuits, Today's electronic design and test engineers deal with several types of subsystems, namely, digital, memory, and mixed-signal, each requiring different test and design for testability methods. This book provides a careful selection of essential topics on , Essentials of Electronic Testing for Digital, Memory, and Mixed-Signal VLSI Circuits

Essentials of Electronic Testing for Digital, Memory, and Mixed-Signal VLSI Circuits

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Essentials of Electronic Testing for Digital, Memory, and Mixed-Signal VLSI Circuits, Today's electronic design and test engineers deal with several types of subsystems, namely, digital, memory, and mixed-signal, each requiring different test and design for testability methods. This book provides a careful selection of essential topics on , Essentials of Electronic Testing for Digital, Memory, and Mixed-Signal VLSI Circuits

Essentials of Electronic Testing for Digital, Memory, and Mixed-Signal VLSI Circuits

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