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Introduction to metrology for micro- and nanotechnology; Some basics of measurement; Precision measurement instrumentation - some design principles; Length traceability using interferometry; Displacement measurement; Surface topography measurement instrumentation; Scanning probe and particle beam microscopy; Surface topography characterisation; Co-ordinate metrology; Mass and force measurement; References; Appendix A: SI units of measurement and their realisation at NPL; Appendix B: SI derived units
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Add Fundamental Principles of Engineering Nanometrology (Micro and Nano Technologies), The principles of engineering metrology applied to the micro- and nanoscale: essential reading for all scientists and engineers involved in the commercialisation of nanotechnology and measurement processes requiring accuracy at the nanoscale. The estab, Fundamental Principles of Engineering Nanometrology (Micro and Nano Technologies) to the inventory that you are selling on WonderClubX
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Add Fundamental Principles of Engineering Nanometrology (Micro and Nano Technologies), The principles of engineering metrology applied to the micro- and nanoscale: essential reading for all scientists and engineers involved in the commercialisation of nanotechnology and measurement processes requiring accuracy at the nanoscale. The estab, Fundamental Principles of Engineering Nanometrology (Micro and Nano Technologies) to your collection on WonderClub |