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Conference Committee | ||
Introduction | ||
In-situ measurement of roughness spectra using diffuse scattering | 2 | |
Application of circular and spherical statistics for the interpretation of BRDF measurements | 13 | |
Scattering of electromagnetic waves from a one-dimensional random metal surface with a localized defect | 25 | |
Sensitivity of far-field speckle pattern to the small local changes of the rough surface geometry | 32 | |
Scanning laser method for measuring surface morphology | 38 | |
Surface roughness in sputtered tin oxide films studied by light scattering and atomic force microscopy | 48 | |
Quality assessment of supersmooth to rough surfaces by multiple-wavelength light scattering measurement | 57 | |
Scattering from sinusoidal gratings | 65 | |
Development of a smooth-surface microroughness standard | 78 | |
Dressed Rayleigh expansion for rough surface scattering | 90 | |
Analysis of near-field optical image of a deterministic surface structure using an exact Rayleigh approach | 97 | |
Scatter-probe near-field optical microscopy of metallic surfaces | 104 | |
Transfer function characterization of scattering surfaces revisited | 113 | |
Comparison of Harvey-Shack scatter theory with experimental measurements | 128 | |
Enhanced backscattering of light from a randomly rough interface between a dipole-active medium and a dielectric | 139 | |
Transverse correlation length for randomly rough surfaces: two-dimensional roughness | 152 | |
Scattering by randomly rough two-dimensional dielectric surfaces | 164 | |
Stokes matrix in cortical scattering from a one-dimensional randomly rough metal surface | 171 | |
Surface plasmon polaritons in light scattering from free-standing randomly rough thin metal films | 186 | |
Design review of an in-situ bidirectional reflectometer | 196 | |
Final design, assembly, and testing of a space-based total integrated scatter instrument | 209 | |
Goniometric optical scatter instrument for bidirectional reflectance distribution function measurements with out-of-plane and polarimetry capabilities | 220 | |
Memory effect in the double passage of waves through a one-dimensional random phase screen | 232 | |
Calibration of optical components for the DS-1 space probe | 242 | |
Speckle correlations in the light scattered and transmitted by dielectric and metal films with rough surfaces | 255 | |
Memory effect from a one-dimensional rough dielectric film on a glass substrate | 269 | |
Phenomenological BRDF modeling for engineering applications | 281 | |
Green function for flourescence from spherical particles located on a substrate | 294 | |
Scanning scattering microscope for surface and buried interface roughness and defect imaging | 302 | |
Scattering from planar surfaces with magnetic and thermal fluctuations | 316 | |
Toward a model accounting for the impact of surface treatment on the performances of scintillation counters | 324 | |
Addendum | 337 | |
Author Index | 338 |
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