Terrestrial Neutron-Induced Soft Errors in Advanced Memory Devices Book

Name: Terrestrial Neutron-Induced Soft Errors in Advanced Memory Device
Brand: WonderClub
SKU: 9789812778819
Price: 103.05 USD
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Terrestrial Neutron-Induced Soft Errors in Advanced Memory Devices, Terrestrial neutron-induced soft errors in semiconductor memory devices are currently a major concern in reliability issues. Understanding the mechanism and quantifying soft-error rates are primarily crucial for the design and quality assurance of semicon, Terrestrial Neutron-Induced Soft Errors in Advanced Memory Devices

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Terrestrial Neutron-Induced Soft Errors in Advanced Memory Devices
Written by author Nakamura, Takashi, Baba, Mamoru, Ibe, Eishi
Published by World Scientific Publishing Company, Incorporated, 2007
Terrestrial neutron-induced soft errors in semiconductor memory devices are currently a major concern in reliability issues. Understanding the mechanism and quantifying soft-error rates are primarily crucial for the design and quality assurance of semicon

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Ch. 1 Introduction 1

Ch. 2 Terrestrial Neutron Spectrometry and Dosimetry 11

Ch. 3 Irradiation Testing in the Terrestrial Field 93

Ch. 4 Neutron Irradiation Test Facilities 139

Ch. 5 Review and Discussion of Experimental Data 175

Ch. 6 Monte Carlo Simulation Methods 219

Ch. 7 Simulation Results and Their Implications 237

Ch. 8 International Standardization of the Neutron Test Method 253

Ch. 9 Summary and Challenges 259

A Appendices 269

A1 Radiological Protection Quantities 269

A2 Approximation Functions for Total Cross Section 273

A3 Approximation Functions for Non-elastic Cross Section 278

A4 Comparison of GEM Calculation Results for Inverse Reaction Cross Section with Literature Data 283

A5 LET Approximation Results in Substrate Used for Silicon Devices 286

A6 Coefficients for LET Calculation for Substrate Used in Silicon Devices 289

References 291

Terms and Definitions 317

Index 335

Title: Terrestrial Neutron-Induced Soft Errors in Advanced Memory Devices

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WonderClub

Item Number: 9789812778819

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Product Description: Terrestrial Neutron-Induced Soft Errors in Advanced Memory Devices

Universal Product Code (UPC): 9789812778819

WonderClub Stock Keeping Unit (WSKU): 9789812778819

Rating: 4/5 based on 1 Reviews

Image Location: https://wonderclub.com/images/covers/88/19/9789812778819.jpg

Category: Media >> Books

Weight: 0.200 kg (0.44 lbs)

Width: 6.100 cm (2.40 inches)

Heigh : 9.100 cm (3.58 inches)

Depth: 0.900 cm (0.35 inches)

Date Added: August 25, 2020, Added By: Ross

Date Last Edited: August 25, 2020, Edited By: Ross

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Terrestrial Neutron-Induced Soft Errors in Advanced Memory Devices, Terrestrial neutron-induced soft errors in semiconductor memory devices are currently a major concern in reliability issues. Understanding the mechanism and quantifying soft-error rates are primarily crucial for the design and quality assurance of semicon, Terrestrial Neutron-Induced Soft Errors in Advanced Memory Devices

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