Synthetic Polymeric Membranes: Characterization by Atomic Force Microscopy Book

Name: Synthetic Polymeric Membranes: Characterization by Atomic Force M
Brand: Steidl Publishing
SKU: 9783642093272
Price: 177.20 USD
Availability: InStock
Rating: 4 (1 reviews)

Synthetic Polymeric Membranes: Characterization by Atomic Force Microscopy, Researchers in polymeric membranes as well as R&D professionals will find this work an essential addition to the literature. It concentrates on the method recently developed to study the surfaces of synthetic polymeric membranes using an Atomic Force , Synthetic Polymeric Membranes: Characterization by Atomic Force Microscopy

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Synthetic Polymeric Membranes: Characterization by Atomic Force Microscopy
Written by author Khulbe, K. C., Feng, C. Y., Matsuura, Takeshi
Published by Springer-Verlag New York, LLC, 11/23/2010
Researchers in polymeric membranes as well as R&D professionals will find this work an essential addition to the literature. It concentrates on the method recently developed to study the surfaces of synthetic polymeric membranes using an Atomic Force

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Book Categories

Authors

Introduction.- Synthetic Membranes for Membrane Processes.- Atomic Force Microscopy.- Nodular Structure of Polymers in the Membrane.- Pore Size, Pore Size Distribution, and Roughness at the Membrane Surface.- Cross-Sectional AFM Image.- Adhesion.- Membrane Surface Morphology and Membrane Performance.

Title: Synthetic Polymeric Membranes: Characterization by Atomic Force Microscopy

Manufacturer:

Steidl Publishing

Item Number: 9783642093272

Number: 1

Product Description: Full Name: Synthetic Polymeric Membranes: Characterization by Atomic Force Microscopy; Short Name:Synthetic Polymeric Membranes

Universal Product Code (UPC): 9783642093272

WonderClub Stock Keeping Unit (WSKU): 9783642093272

Rating: 4/5 based on 1 Reviews

Image Location: https://wonderclub.com/images/covers/32/72/9783642093272.jpg

Category: Media >> Books

Weight: 0.200 kg (0.44 lbs)

Width: 0.460 cm (0.18 inches)

Heigh : 6.140 cm (2.42 inches)

Depth: 9.210 cm (3.63 inches)

Date Added: August 25, 2020, Added By: Ross

Date Last Edited: August 25, 2020, Edited By: Ross

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Synthetic Polymeric Membranes: Characterization by Atomic Force Microscopy, Researchers in polymeric membranes as well as R&D professionals will find this work an essential addition to the literature. It concentrates on the method recently developed to study the surfaces of synthetic polymeric membranes using an Atomic Force , Synthetic Polymeric Membranes: Characterization by Atomic Force Microscopy

Add Synthetic Polymeric Membranes: Characterization by Atomic Force Microscopy, Researchers in polymeric membranes as well as R&D professionals will find this work an essential addition to the literature. It concentrates on the method recently developed to study the surfaces of synthetic polymeric membranes using an Atomic Force , Synthetic Polymeric Membranes: Characterization by Atomic Force Microscopy to the inventory that you are selling on WonderClub

Add Synthetic Polymeric Membranes: Characterization by Atomic Force Microscopy, Researchers in polymeric membranes as well as R&D professionals will find this work an essential addition to the literature. It concentrates on the method recently developed to study the surfaces of synthetic polymeric membranes using an Atomic Force , Synthetic Polymeric Membranes: Characterization by Atomic Force Microscopy to your collection on WonderClub

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