Scattering & Surface Roughness: 30-31 July 1997, San Diego, California Book

	Conference Committee
	Introduction
	In-situ measurement of roughness spectra using diffuse scattering	2
	Application of circular and spherical statistics for the interpretation of BRDF measurements	13
	Scattering of electromagnetic waves from a one-dimensional random metal surface with a localized defect	25
	Sensitivity of far-field speckle pattern to the small local changes of the rough surface geometry	32
	Scanning laser method for measuring surface morphology	38
	Surface roughness in sputtered tin oxide films studied by light scattering and atomic force microscopy	48
	Quality assessment of supersmooth to rough surfaces by multiple-wavelength light scattering measurement	57
	Scattering from sinusoidal gratings	65
	Development of a smooth-surface microroughness standard	78
	Dressed Rayleigh expansion for rough surface scattering	90
	Analysis of near-field optical image of a deterministic surface structure using an exact Rayleigh approach	97
	Scatter-probe near-field optical microscopy of metallic surfaces	104
	Transfer function characterization of scattering surfaces revisited	113
	Comparison of Harvey-Shack scatter theory with experimental measurements	128
	Enhanced backscattering of light from a randomly rough interface between a dipole-active medium and a dielectric	139
	Transverse correlation length for randomly rough surfaces: two-dimensional roughness	152
	Scattering by randomly rough two-dimensional dielectric surfaces	164
	Stokes matrix in cortical scattering from a one-dimensional randomly rough metal surface	171
	Surface plasmon polaritons in light scattering from free-standing randomly rough thin metal films	186
	Design review of an in-situ bidirectional reflectometer	196
	Final design, assembly, and testing of a space-based total integrated scatter instrument	209
	Goniometric optical scatter instrument for bidirectional reflectance distribution function measurements with out-of-plane and polarimetry capabilities	220
	Memory effect in the double passage of waves through a one-dimensional random phase screen	232
	Calibration of optical components for the DS-1 space probe	242
	Speckle correlations in the light scattered and transmitted by dielectric and metal films with rough surfaces	255
	Memory effect from a one-dimensional rough dielectric film on a glass substrate	269
	Phenomenological BRDF modeling for engineering applications	281
	Green function for flourescence from spherical particles located on a substrate	294
	Scanning scattering microscope for surface and buried interface roughness and defect imaging	302
	Scattering from planar surfaces with magnetic and thermal fluctuations	316
	Toward a model accounting for the impact of surface treatment on the performances of scintillation counters	324
	Addendum	337
	Author Index	338