Scattering and Surface Roughness II Book

	Conference Committee
	Design and synthesis of random uniform diffusers	2
	Spectral changes of light scattered from a random metal suface in the Otto attenuated total reflection configuration	14
	High-frequency approximations of the full-wave solutions to single- and double-scatter cross sections for two-dimensional random rough surfaces	32
	Application of MOMI iteration to solve the magnetic and electric field integral equations	41
	Modified Beckmann-Kirchoff scattering theory for nonparaxial angles	51
	Iterative approach to solving the magnetic and electric field integral equations for scattering by a dielectric thin film	57
	Effective mirror constituent of light scattering on a rough surface and light transfer in optical devices	63
	Experimental studies of scatter-probe near-field optical microscopy	76
	Surface electromagnetic waves in near-field optical scanning microscopy	81
	Features in the speckle correlations of light scattered from volume-disordered dielectric media	96
	Detection of subsurface defects	106
	Analysis of microstructure changes and dynamic processes on rough surfaces using speckle correlation	113
	Parametric optical surface roughness measurement by means of polychromatic speckle autocorrelation	124
	Computer simulation studies of the speckle correlations of light scattered from a random array of dielectric spheres	134
	Polarization and surface roughness	144
	Polarization measurement of the light scattered by dielectric randomly rough isotropic surfaces	153
	Polarization of out-of-plane optical scatter from SiO[subscript 2] films grown on photolithographically generated microrough silicon	160
	Polarization of scattering by rough surfaces	169
	Rough-surface-enhanced scattering	181
	Diffuse reflectance of sintered and pressed polytetrafluoroethylene	190
	Light reflection from a porous surface where the size of the pore is near the wavelength	195
	Application of optical scatterometry to microelectronics and flat panel display processing	202
	NIST virtual/physical random-profile roughness calibration standards	213
	Characterization of planarity of polymer thin films on rough surfaces	222
	Roughness evaluation from ultrapure fluid transfer surface materials for microelectronics fabrication	229
	Handheld directional reflectometer: an angular imaging device to measure BRDF and HDR in real time	240
	Evaluation of in-situ ARS sensors for characterizing smooth and rough surfaces	252
	Comparison of PSD measurements using stray light sensors with PSD curves evaluated from topography of large AFM scans	262
	Novel statistical calibration method for laser scanners	273
	Ultraviolet scattering by thin carbon foils	284
	Optical design of the INTEGRAL Optical Monitoring Camera	296
	Globally accessible bidirectional scattering distribution function software data tool	303
	Modeling the affect of multiple beam clipping in FIR and submillimeter instrumentation: ISO-LWS and FIRST-SPIRE	313
	Modifying the Harvey-Shack surface scatter theory	326
	BRDF measurements of a new IR black coating with lower reflectance	333
	INTEGRAL's Optical Monitoring Camera stray-light design	344
	Common-path heterodyne interferometer with automatic focusing system for online surface profiling	354
	Computation of the intensity distribution for a film on a GRIN substrate	360
	Scatterometer at Korea Research Institute of Standards and Science (KRISS) for bidirectional reflectance distribution function (BRDF)	371
	Addendum	380
	Author Index	381