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| Message from the Chairs | ||
| Conference Committee | ||
| TTTC Information | 180 | |
| Embedded Memory Test and Repair | ||
| Defect-Oriented Analysis of Memory BIST Tests | 7 | |
| A BIST-Based Solution for the Diagnosis of Embedded Memories Adopting Image Processing Techniques | 12 | |
| A Scan-Bist Environment for Testing Embedded Memories | 17 | |
| Soft Error Protection for Embedded Memories | ||
| Fast and Compact Error Correcting Scheme for Reliable Multilevel Flash Memories | 27 | |
| High Speed 15 ns 4 Mbits SRAM for Space Application | 32 | |
| The YATE Fail-Safe Interface: The User's Point of View | 39 | |
| Fault Tolerant Insertion and Verification: A Case Study | 44 | |
| Design and Implementation of a Self-Checking Scheme for Railway Trackside Systems | 49 | |
| A Silicon-Based Yield Gain Evaluation Methodology for Embedded-SRAMs with Different Redundancy Scenarios | 57 | |
| A March-Based Fault Location Algorithm for Static Random Access Memories | 62 | |
| A Simulator for Evaluating Redundancy Analysis Algorithms of Repairable Embedded Memories | 68 | |
| Challenges and Opportunities Created by the SoC Shockwave | ||
| Design and Test of a 9-Port SRAM for a 100 Gb/s STS-1 Switch | 83 | |
| Design of Embedded System for Video Coding with Logic-Enhanced DRAM and Configurable Process | ||
| Adder Merged DRAM Architecture | 88 | |
| March SS: A Test for All Static Simple RAM Faults | 95 | |
| Random Testing of Multi-Port Static Random Access Memories | 101 | |
| A Fault Modeling Technique to Test Memory BIST Algorithms | 109 | |
| Fault Modeling and Pattern-Sensitivity Testing for a Multilevel DRAM | 117 | |
| An Investigation into Crosstalk Noise in DRAM Structures | 123 | |
| SoC's Trends and Challenges going to 0.10 [mu]m | ||
| An Automated Design Methodology for EEPROM Cell (ADE) | 137 | |
| A Novel Memory Array Based on an Annular Single-Poly EPROM Cell for Use in Standard CMOS Technology | 143 | |
| A New Single Ended Sense Amplifier for Low Voltage Embedded EEPROM Non Volatile Memories | 149 | |
| Validated 90 nm CMOS Technology Platform with Low-k Copper Interconnects for Advanced System-on-Chip (SoC) | ||
| Converting an Embedded Low-Power SRAM from Bulk to PD-SOI | 163 | |
| Decreasing EEPROM Programming Bias with Negative Voltage, Reliability Impact | 168 | |
| Panel on Advanced Embedded Memory Technologies | 177 | |
| Author Index | 179 |
| Price | Condition | Delivery | Seller | Action |
| $115.83 | Digital |
| WonderClub |
Joakim Gunnarsson
reviewed Proceedings of the 2002 IEEE International Workshop on Memory Technology, Design and Testing... on February 09, 2010
Proceedings of the 2002 IEEE International Workshop on Memory Technology
Originally reviewed for YA Books Central:
Disclaimer: Unfortunately I was issued only a one-chapter sample of the book (15 pages) rather than the book in its 256 page entirety. As such, my impressions are woefully limited in some respects—for which I apologize.
I absolutely loved the idea of this book. As huge fans of Alton Brown’s famously cerebral cooking show, Good Eats, my kids have long enjoyed the marriage of recipes and ingenious explanations for the scientific concepts behind them. My hope was that Science Experiments You Can Eat would provide them with a similar merger of visual, whimsical, and interactive.
The book’s recommended age range is 8-12 year olds, but due to minimal illustrations and lots of dense text making use of more advanced vocabulary, I would recommend it as better suited for ages 10 and up. The meringue experiment (exploring the properties of egg whites) felt like an interesting and age-appropriate choice—given appropriate adult supervision. The explanations for why protein molecules behave the way they do under various conditions was clear and concise, albeit a bit dry in presentation.
I regret that, due to the sample size, I can’t comment on the efficiency of the overarching buildup in lessons and concepts. I also wish I could offer a rundown of my favorite section and experiment. (The chapter I was given was actually chapter 5 out of 11, and so I’m not certain how much more I might have appreciated the progression if I’d been able to read what led up to it.)
According to the table of contents, the chapters are labeled as follows:
Food For Thought; Solutions; Suspensions, Colloids, And Emulsions; Carbohydrates And Fats; Proteins; Kitchen Chemistry; Plants We Eat; Microwave Cooking; Microbes; Enzymes And Hormones; and Science Experiments We Do Eat. Additional tools listed include: Measuring Calories, How To Read A Nutrition Facts Label, Cooking Terms And Instructions, Equivalent Measures, and Scientific Glossary.
Science Experiments You Can Eat is inspired in concept and strong on the technical front. I would have liked to see more illustrative engagement in what small portion of it I was shown, but I do suspect the complete product would be a useful learning tool for kids in more of a Middle Grade range.
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