Sold Out
Book Categories |
Message from the General Chair | ||
Message from the Program Chair | ||
Technical Program Committee | ||
Keynote Speech: Challenges in Memory - Logic Integration | 2 | |
Modeling Application Specific Memories | 10 | |
A Modeling and Circuit Reduction Methodology for Circuit Simulation of DRAM Circuits | 15 | |
A New Serial Sensing Approach for Multistorage Non-Volatile Memories | 21 | |
Technology and Layout Related Testing | 28 | |
Embedded RAM Testing | 29 | |
A Bipartite, Differential I[subscript DDQ] Testable Static RAM Design | 36 | |
CMOS SRAM Test Based on Quiescent Supply Current in Write Operation | 42 | |
Detection of Faults in ECL Storage Elements | 48 | |
Automatic Computation of Test Length for Pseudo-Random Memory Tests | 56 | |
An Efficient Test Method for Embedded Multi-port RAM with BIST Circuitry | 62 | |
A 5 Gb/s 9-Port Application Specific SRAM with Built-In Self Test | 68 | |
AN 2 Cycle 1Mbit 4 Way Set Associative 4 Way Interleave Multi-processor L2 Directory with Array Access/Cycle 2.5 nsec | 76 | |
Optimization of Memory Organization and Hierarchy for Decreased Size and Power in Video and Image Processing Systems | 82 | |
Logic-Enhanced Memories for Data-Intensive Processing | 88 | |
The Rambus Memory System | 94 | |
Performance in Real-Time Main-Memory Databases | 97 | |
Gallium Arsenide MESFET Memory Architectures | 103 | |
Yield and Cost Estimation for a CAM÷Based Parallel Processor | 110 | |
Deterministic Tests for Detecting Scrambled Pattern-Sensitive Faults in RAMs | 117 | |
Composition of Multiple Faults in RAMs | 123 | |
Author Index | 129 |
Login|Complaints|Blog|Games|Digital Media|Souls|Obituary|Contact Us|FAQ
CAN'T FIND WHAT YOU'RE LOOKING FOR? CLICK HERE!!! X
You must be logged in to add to WishlistX
This item is in your Wish ListX
This item is in your CollectionMemory Technology, Design and Testing
X
This Item is in Your InventoryMemory Technology, Design and Testing
X
You must be logged in to review the productsX
X
X
Add Memory Technology, Design and Testing, , Memory Technology, Design and Testing to the inventory that you are selling on WonderClubX
X
Add Memory Technology, Design and Testing, , Memory Technology, Design and Testing to your collection on WonderClub |