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The 14 papers in this collection from the August 2001 workshop are divided into five sessions on semiconductor memory design, BIST, redundancy and error control, fault models and multi-port SRAM testing, and verification and testing. Some of the topics are evaluation of redundancy analysis algorithms, a parallel approach for testing multi-port static random access memories, a low output resistance charge pump for flash memory programming, BIST-based bitfail mapping of an embedded DRAM, and an orthogonal transpose-RAM cell array architecture with an alternate bit-line to bit-line contact scheme. No subject index.
Annotation c. Book News, Inc., Portland, OR (booknews.com)
| Price | Condition | Delivery | Seller | Action |
| $101.25 | Digital |
| WonderClub |
Tomas Lajdar
reviewed Memory Technology, Design, and Testing 2001 2001 IEEE International Workshop on July 28, 2017
Memory Technology
Excellent book dealing with every facet of the Last Journey: Death. Covered is everything from how the most ancient peoples dealt with death to modern times; causes of death (in the U.S. v. U. K.) with stats; burial customs; taking care of bodies after death (such as embalming); religious views and practices, and much more! Included are photos that help illustrate the topics at hand. A must read for thanatophiles (death lovers)!
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Add Memory Technology, Design, and Testing 2001 2001 IEEE International Workshop, The 14 papers in this collection from the August 2001 workshop are divided into five sessions on semiconductor memory design, BIST, redundancy and error control, fault models and multi-port SRAM testing, and verification and testing. Some of the topics ar, Memory Technology, Design, and Testing 2001 2001 IEEE International Workshop to the inventory that you are selling on WonderClubX
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Add Memory Technology, Design, and Testing 2001 2001 IEEE International Workshop, The 14 papers in this collection from the August 2001 workshop are divided into five sessions on semiconductor memory design, BIST, redundancy and error control, fault models and multi-port SRAM testing, and verification and testing. Some of the topics ar, Memory Technology, Design, and Testing 2001 2001 IEEE International Workshop to your collection on WonderClub |