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Lock-In Thermography : Basics and Applications to Functional Diagnostics of Electronic Components Book

Lock-In Thermography : Basics and Applications to Functional Diagnostics of Electronic Components
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Lock-In Thermography : Basics and Applications to Functional Diagnostics of Electronic Components, The book deals with lock–in thermography as a special variant of the well known IR thermography for all applications where the heat of the sample can be pulsed. Compared to steady–state thermography, the lock–in mode enables a much improved signal/noise r, Lock-In Thermography : Basics and Applications to Functional Diagnostics of Electronic Components
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  • Lock-In Thermography : Basics and Applications to Functional Diagnostics of Electronic Components
  • Written by author O. Breitenstein, M. Langenkamp
  • Published by Springer, 2003/05/28
  • The book deals with lock–in thermography as a special variant of the well known IR thermography for all applications where the heat of the sample can be pulsed. Compared to steady–state thermography, the lock–in mode enables a much improved signal/noise r
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Book Categories

Authors

1 Introduction 1
2 Physical and Technical Basics 7
3 Experimental Technique 39
4 Theory 69
5 Measurement Strategies 115
6 Typical Applications 143
7 Summary and Outlook 169
References 173
A Thermal and IR Properties of Selected Materials 181
B Digital Micrograph Scripts for FFT Deconvolution 183
List of Symbols 185
Abbreviations 189
Index 191


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Lock-In Thermography : Basics and Applications to Functional Diagnostics of Electronic Components, The book deals with lock–in thermography as a special variant of the well known IR thermography for all applications where the heat of the sample can be pulsed. Compared to steady–state thermography, the lock–in mode enables a much improved signal/noise r, Lock-In Thermography : Basics and Applications to Functional Diagnostics of Electronic Components

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Lock-In Thermography : Basics and Applications to Functional Diagnostics of Electronic Components, The book deals with lock–in thermography as a special variant of the well known IR thermography for all applications where the heat of the sample can be pulsed. Compared to steady–state thermography, the lock–in mode enables a much improved signal/noise r, Lock-In Thermography : Basics and Applications to Functional Diagnostics of Electronic Components

Lock-In Thermography : Basics and Applications to Functional Diagnostics of Electronic Components

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Lock-In Thermography : Basics and Applications to Functional Diagnostics of Electronic Components, The book deals with lock–in thermography as a special variant of the well known IR thermography for all applications where the heat of the sample can be pulsed. Compared to steady–state thermography, the lock–in mode enables a much improved signal/noise r, Lock-In Thermography : Basics and Applications to Functional Diagnostics of Electronic Components

Lock-In Thermography : Basics and Applications to Functional Diagnostics of Electronic Components

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