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Foreword | ||
Preface | ||
1 | Introduction | 1 |
2 | Defect Semantics and Yield Modeling | 7 |
3 | Computational Models for Defect-Sensitivity | 29 |
4 | Single Defect Multiple Layer (SDML) Model | 49 |
5 | Fault Analysis and Multiple Layer Critical Areas | 79 |
6 | Single Defect Single Layer (SDSL) Model | 93 |
7 | IC Yield Prediction and Single Layer Critical Areas | 109 |
8 | Single vs. Multiple Layer Critical Areas | 125 |
References | 137 | |
Appendix 1: Sources of Defect Mechanisms | 147 | |
Appendix 2: End Effects of Critical Regions | 151 | |
Appendix 3: NMOS Technology File | 159 | |
Index | 163 |
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Add Integrated Circuit Defect-Sensitivity, Spot defects are random phenomena present in every fabrication line. As technological processes mature towards submicron features, the effect of these defects on the functional and parametric behavior of the IC becomes crucial. Integrated Circuit Def, Integrated Circuit Defect-Sensitivity to the inventory that you are selling on WonderClubX
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Add Integrated Circuit Defect-Sensitivity, Spot defects are random phenomena present in every fabrication line. As technological processes mature towards submicron features, the effect of these defects on the functional and parametric behavior of the IC becomes crucial. Integrated Circuit Def, Integrated Circuit Defect-Sensitivity to your collection on WonderClub |