Design and Analysis of Accelerated Tests for Mission Critical Reliability Book

BACKGROUND
Introduction
Other Approaches
The Foundation of our Approach
An Example
The Organization of this Book
Complement to Chapter 1: Background Kinetics and Statistics
DEMARCATION MAPPING: INITIAL DESIGN OF ACCELERATED TESTS
Analytical Theory of Thermal Demarcation Maps
Designing an Acceptance Test for a Purely Thermal Process
Simple Temperature Humidity Models
Designing an Acceptance Test for a Temperature Humidity Model
Mechanical Cycling Models
Acceptance Testing for Mechanical Cycling Induced by Thermal Cycling
Computational Demarcation Mapping
Beta Binomial Interpretation of 0 Failures
An Extrapolation Theorem
Summary
Complements to Chapter 2
INTERFACE FOR BUILDING KINETIC MODELS
Descriptions and Concepts Behind the Interface
Complement to Chapter 3, Our Interface in S-PLUS®, Kinetic Data Objects and the GUIs to Create Them
EVANESCENT PROCESS MAPPING
Building Blocks for the Theory
Identifying Neighborhoods of Models, Sampling, and "Chunking"
Example
Summary, Limitations of Accelerated Testing
Complement to Chapter 4: Using the Evanescent Process Mapping Interface to duplicate example 4.3
DATA ANALYSIS FOR FAILURE TIME DATA
A Simple Data Set
Adding Physical Sense to the Model
Analysis of a Real Data Set
Complement: Maximum Likelihood Analysis
Complement: Statistical Estimation of Kinetics from Failure Time Data
Complement: Pseudo Maximum Likelihood Estimation
Complement: The Kaplan Meier Estimate
Complement: Printed Wiring Board Data
Complement: Using the Interface
Complement: Exercises to Explore some Questions in Experiment Design
DATA ANALYSIS FOR DEGRADATION DATA
Motivation and Models
Background for the Example
Data Analysis for the Example
Complement: Background Statistical Theory
Complement: Using the Software to Analyse the Example Data
Complement: Exercises for Data Analysis and Experiment Design