Defects in Silicon Induced by High Temperature Treatment and Their Influence on MOS-Devices: A Thesis Submitted to the Swiss Federal Institute of Technology Zurich for the Degree o Book

Name: Defects in Silicon Induced by High Temperature Treatment and Thei
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SKU: 9783907574034
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Defects in Silicon Induced by High Temperature Treatment and Their Influence on MOS-Devices: A Thesis Submitted to the Swiss Federal Institute of Technology Zurich for the Degree o, , Defects in Silicon Induced by High Temperature Treatment and Their Influence on MOS-Devices: A Thesis Submitted to the Swiss Federal Institute of Technology Zurich for the Degree of Doctor of Technical Sciences

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Defects in Silicon Induced by High Temperature Treatment and Their Influence on MOS-Devices: A Thesis Submitted to the Swiss Federal Institute of Technology Zurich for the Degree of Doctor of Technical Sciences
Written by author Michael Dammann
Published by Physical Electronics Laboratory, Swiss Federal Institute of Technology, January 1994

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Title: Defects in Silicon Induced by High Temperature Treatment and Their Influence on MOS-Devices: A Thesis Submitted to the Swiss Federal Institute of Technology Zurich for the Degree o

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WonderClub

Item Number: 9783907574034

Publication Date: January 1994

Number: 1

Product Description: Full Name: Defects in Silicon Induced by High Temperature Treatment and Their Influence on MOS-Devices: A Thesis Submitted to the Swiss Federal Institute of Technology Zurich for the Degree o; Short Name:Defects in Silicon Induced by High Temperature Treatment and Their Influence on MOS-Devices

Universal Product Code (UPC): 9783907574034

WonderClub Stock Keeping Unit (WSKU): 9783907574034

Rating: 4/5 based on 1 Reviews

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Weight: 0.200 kg (0.44 lbs)

Width: 0.000 cm (0.00 inches)

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Depth: 0.000 cm (0.00 inches)

Date Added: August 25, 2020, Added By: Ross

Date Last Edited: August 25, 2020, Edited By: Ross

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Defects in Silicon Induced by High Temperature Treatment and Their Influence on MOS-Devices: A Thesis Submitted to the Swiss Federal Institute of Technology Zurich for the Degree o, , Defects in Silicon Induced by High Temperature Treatment and Their Influence on MOS-Devices: A Thesis Submitted to the Swiss Federal Institute of Technology Zurich for the Degree of Doctor of Technical Sciences

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