Charge Trapping Study of Hafnium-Based Gate Dielectrics for Advanced CMOS Technology. Book

Name: Charge Trapping Study of Hafnium-Based Gate Dielectrics for Advan
Brand: WonderClub
SKU: 9781243645951
Price: 99.99 USD
Availability: InStock
Rating: 4 (1 reviews)

Charge Trapping Study of Hafnium-Based Gate Dielectrics for Advanced CMOS Technology., , Charge Trapping Study of Hafnium-Based Gate Dielectrics for Advanced CMOS Technology.

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Charge Trapping Study of Hafnium-Based Gate Dielectrics for Advanced CMOS Technology.
Written by author Liyang Song
Published by , September 2011

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Title: Charge Trapping Study of Hafnium-Based Gate Dielectrics for Advanced CMOS Technology.

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Item Number: 9781243645951

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Product Description: Charge Trapping Study of Hafnium-Based Gate Dielectrics for Advanced CMOS Technology.

Universal Product Code (UPC): 9781243645951

WonderClub Stock Keeping Unit (WSKU): 9781243645951

Rating: 4/5 based on 1 Reviews

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Category: Media >> Books

Weight: 0.200 kg (0.44 lbs)

Width: 0.000 cm (0.00 inches)

Heigh : 0.000 cm (0.00 inches)

Depth: 0.000 cm (0.00 inches)

Date Added: August 25, 2020, Added By: Ross

Date Last Edited: August 25, 2020, Edited By: Ross

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$99.99	Digital	Arrives between May 7 - Jun 6 Login to your account for a direct download. Some files are emailed from Dropbox. Continent $0.00 - World $0.00	WonderClub (9296 total ratings)

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