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High Resolution X-Ray Diffractometry and Topography Book

High Resolution X-Ray Diffractometry and Topography
High Resolution X-Ray Diffractometry and Topography, , High Resolution X-Ray Diffractometry and Topography has a rating of 3.5 stars
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High Resolution X-Ray Diffractometry and Topography, , High Resolution X-Ray Diffractometry and Topography
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  • High Resolution X-Ray Diffractometry and Topography
  • Written by author D. Keith Bowen Keith
  • Published by Taylor & Francis, Inc., February 1998
  • The study and application of electronic materials has created an increasing demand for sophisticated and reliable techniques for examining and characterizing these materials. This comprehensive book looks at the area of x-ray diffraction and the modern te
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Introduction- diffraction studies of crystal perfection; high resolution X- ray diffraction techniques; analysis of expitaxial layers; X-ray scattering theory; simulation of X-ray diffraction rocking curves; analysis of thin films and multiple layers; triple axis X-ray diffractometry; single crystal X-ray topography; double crystal X-ray topography; synchrotron radiation topography.


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