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Book Categories |
| Foreword | ||
| Preface | ||
| 1 | Introduction | 1 |
| 2 | Background | 13 |
| 3 | Contamination-Defect-Fault (CDF) Simulation | 37 |
| 4 | CDF Mapper CODEF | 47 |
| 5 | CODEF - Applications | 85 |
| 6 | Possible Extensions | 115 |
| 7 | Conclusion | 121 |
| Appendix A: CMOS Process Flow | 123 | |
| Index | 145 |
| Price | Condition | Delivery | Seller | Action |
| $193.00 | Digital |
| WonderClub |
Carlos Postiga
reviewed From Contamination to Defects, Faults and Yield Loss on April 30, 2018
From Contamination to Defects, Faults and Yield Loss
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