Integrated Circuit Defect-Sensitivity Book

Name: Integrated Circuit Defect-Sensitivity, Spot defects are random ph
Brand: Steidl Publishing
SKU: 9780792393061
Price: 168.29 USD
Availability: InStock
Rating: 3.5 (2 reviews)

2 Ratings

Integrated Circuit Defect-Sensitivity, Spot defects are random phenomena present in every fabrication line. As technological processes mature towards submicron features, the effect of these defects on the functional and parametric behavior of the IC becomes crucial. Integrated Circuit Def, Integrated Circuit Defect-Sensitivity

3.5 out of 5 stars based on 2 reviews

Integrated Circuit Defect-Sensitivity
Written by author Jos Pineda de Gyvez
Published by Springer-Verlag New York, LLC, December 2009
Spot defects are random phenomena present in every fabrication line. As technological processes mature towards submicron features, the effect of these defects on the functional and parametric behavior of the IC becomes crucial. Integrated Circuit Def
Spot defects are random phenomena present in every fabrication line. As technological processes mature towards submicron features, the effect of these defects on the functional and parametric behavior of the IC becomes crucial. Integrated Circuit Def

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Foreword
Preface
1 Introduction 1
2 Defect Semantics and Yield Modeling 7
3 Computational Models for Defect-Sensitivity 29
4 Single Defect Multiple Layer (SDML) Model 49
5 Fault Analysis and Multiple Layer Critical Areas 79
6 Single Defect Single Layer (SDSL) Model 93
7 IC Yield Prediction and Single Layer Critical Areas 109
8 Single vs. Multiple Layer Critical Areas 125
References 137
Appendix 1: Sources of Defect Mechanisms 147
Appendix 2: End Effects of Critical Regions 151
Appendix 3: NMOS Technology File 159
Index 163

Title: Integrated Circuit Defect-Sensitivity

Manufacturer:

Steidl Publishing

Item Number: 9780792393061

Publication Date: December 2009

Number: 1

Product Description: Integrated Circuit Defect-Sensitivity

Universal Product Code (UPC): 9780792393061

WonderClub Stock Keeping Unit (WSKU): 9780792393061

Rating: 3.5/5 based on 2 Reviews

Image Location: https://wonderclub.com/images/covers/30/61/9780792393061.jpg

Category: Media >> Books

Weight: 0.200 kg (0.44 lbs)

Width: 9.210 cm (3.63 inches)

Heigh : 6.140 cm (2.42 inches)

Depth: 0.500 cm (0.20 inches)

Date Added: August 25, 2020, Added By: Ross

Date Last Edited: August 25, 2020, Edited By: Ross

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Marie Davis

reviewed Integrated Circuit Defect-Sensitivity on October 23, 2018

Integrated Circuit Defect-Sensitivity

I am not sure who the audience for this book is. The beginning chapters are obviously geared toward beginners, but the later chapters are quite complex - a remarkable range for a book under 400 pages. The book does a very poor job clearly explaining advanced topics.

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Integrated Circuit Defect-Sensitivity, Spot defects are random phenomena present in every fabrication line. As technological processes mature towards submicron features, the effect of these defects on the functional and parametric behavior of the IC becomes crucial.
Integrated Circuit Def, Integrated Circuit Defect-Sensitivity

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Integrated Circuit Defect-Sensitivity Book

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	Foreword
	Preface
1	Introduction	1
2	Defect Semantics and Yield Modeling	7
3	Computational Models for Defect-Sensitivity	29
4	Single Defect Multiple Layer (SDML) Model	49
5	Fault Analysis and Multiple Layer Critical Areas	79
6	Single Defect Single Layer (SDSL) Model	93
7	IC Yield Prediction and Single Layer Critical Areas	109
8	Single vs. Multiple Layer Critical Areas	125
	References	137
	Appendix 1: Sources of Defect Mechanisms	147
	Appendix 2: End Effects of Critical Regions	151
	Appendix 3: NMOS Technology File	159
	Index	163