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Preface;
1. Operational and plotting techniques;
2. Examination of uniaxial crystals;
3. Examination of biaxial crystals;
4. Index variation methods and extrapolation;
5. Index measurements: accuracy, precision, and techniques;
6. Computer determination of 2V and of X, Y, and Z and their dispersion;
7. Combined optical and X-ray studies of crystals;
8. calculating principal birefringences (and 2V) from retardation measurements;
9. Epilogue and applications; Appendixes; Answers to questions and problems; Notes; References; Index.
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