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Ch. 1 | The Development of Energy Dispersive Electron Probe Analysis | |
Ch. 2 | Problems and Trends in X-Ray Detector Design for Microanalysis | |
Ch. 3 | Current Trends in Si(Li) Detector Windows for Light Element Analysis | |
Ch. 4 | Germanium X-Ray Detectors | |
Ch. 5 | Modeling the Energy Dispersive X-Ray Detector | |
Ch. 6 | The Effect of Detector Dead Layers on Light Element Detection | |
Ch. 7 | Energy Dispersive X-Ray Spectrometry in Ultra-high Vacuum Environments | |
Ch. 8 | Quantifying Benefits of Resolution and Count Rate in EDX Microanalysis | |
Ch. 9 | Improving EDS Performance with Digital Pulse Processing | |
Ch. 10 | A Study of Systematic Errors in Multiple Linear Regression Peak Fitting Using Generated Spectra | |
Ch. 11 | Artifacts in Energy Dispersive X-Ray Spectrometry in Electron Beam Instruments. Are Things Getting Any Better? | |
Ch. 12 | Characterizing an Energy Dispersive Spectrometer on an Analytical Electron Microscope | |
Ch. 13 | Wavelength Dispersive Spectrometry: A Review | |
Ch. 14 | Synthetic Multilayer Crystals for EPMA of Ultra-light Elements | |
Ch. 15 | A von Hamos-Type Parallel Collection Wavelength Dispersive Spectrometer for Microbeam Analysis | |
Ch. 16 | Fitting Wavelength Dispersive Spectra with the NIST/NIH DTSA Program | |
Ch. 17 | Application of Layered Synthetic Microstructure Crystals to WDX Microanalysis of Ultra-light Elements | |
Ch. 18 | An Evaluation of Quantitative Electron Probe Methods | |
Index |
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