X-Ray Scattering from Semiconductors (2nd Edition) Book

Name: X-Ray Scattering from Semiconductors (2nd Edition), X-ray scatter
SKU: 9781860943607
Price: 104.30 USD
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X-Ray Scattering from Semiconductors (2nd Edition), X-ray scattering is used extensively to provide detailed structural information about materials. Semiconductors have benefited from X-ray scattering techniques as an essential feedback method for crystal growth, including compositional and thickness deter, X-Ray Scattering from Semiconductors (2nd Edition)

3 out of 5 stars based on 2 reviews

X-Ray Scattering from Semiconductors (2nd Edition)
Written by author Paul F. Fewster
Published by Imperial College Press, July 2003
X-ray scattering is used extensively to provide detailed structural information about materials. Semiconductors have benefited from X-ray scattering techniques as an essential feedback method for crystal growth, including compositional and thickness deter
Fewster (Philips Analytical Research Center, UK) discusses the X-ray scattering methods used for the structural analysis of a range of semiconductor materials, emphasizing those structural properties that influence physical properties. The text covers the

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Ch. 1 An Introduction to Semiconductor Materials
Ch. 2 An Introduction to X-Ray Scattering
Ch. 3 Equipment for Measuring Diffraction Patterns
Ch. 4 A Practical Guide to the Evaluation of Structural Parameters
App. 1 General Crystallographic Relations
Subject Index

Title: X-Ray Scattering from Semiconductors (2nd Edition)

Item Number: 9781860943607

Publication Date: July 2003

Number: 2

Product Description: Full Name: X-Ray Scattering from Semiconductors (2nd Edition); Short Name:X-Ray Scattering from Semiconductors

Universal Product Code (UPC): 9781860943607

WonderClub Stock Keeping Unit (WSKU): 9781860943607

Rating: 3/5 based on 2 Reviews

Image Location: https://wonderclub.com/images/covers/36/07/9781860943607.jpg

Category: Media >> Books

Weight: 0.200 kg (0.44 lbs)

Width: 15.800 cm (6.22 inches)

Heigh : 23.200 cm (9.13 inches)

Depth: 2.600 cm (1.02 inches)

Date Added: August 25, 2020, Added By: Ross

Date Last Edited: August 25, 2020, Edited By: Ross

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$104.30	Digital	Arrives between Apr 28 - May 28 Login to your account for a direct download. Some files are emailed from Dropbox. Continent $0.00 - World $0.00	WonderClub (17063 total ratings)

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Don Whilhoit

reviewed X-Ray Scattering from Semiconductors (2nd Edition) on March 09, 2016

X-Ray Scattering from Semiconductors (2nd Edition)

Perfect for self study if you don't know much about semiconductor physics. Content relatively easy and easy to find exercise solution online. I think it's clearer than Sze's book.

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X-Ray Scattering from Semiconductors (2nd Edition), X-ray scattering is used extensively to provide detailed structural information about materials. Semiconductors have benefited from X-ray scattering techniques as an essential feedback method for crystal growth, including compositional and thickness deter, X-Ray Scattering from Semiconductors (2nd Edition)

Add X-Ray Scattering from Semiconductors (2nd Edition), X-ray scattering is used extensively to provide detailed structural information about materials. Semiconductors have benefited from X-ray scattering techniques as an essential feedback method for crystal growth, including compositional and thickness deter, X-Ray Scattering from Semiconductors (2nd Edition) to the inventory that you are selling on WonderClub

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Add X-Ray Scattering from Semiconductors (2nd Edition), X-ray scattering is used extensively to provide detailed structural information about materials. Semiconductors have benefited from X-ray scattering techniques as an essential feedback method for crystal growth, including compositional and thickness deter, X-Ray Scattering from Semiconductors (2nd Edition) to your collection on WonderClub

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Ch. 1	An Introduction to Semiconductor Materials
Ch. 2	An Introduction to X-Ray Scattering
Ch. 3	Equipment for Measuring Diffraction Patterns
Ch. 4	A Practical Guide to the Evaluation of Structural Parameters
App. 1	General Crystallographic Relations
	Subject Index