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Introduction.- Review of CMP Modeling.- Material Removal Mechanism in CMP.- Effects of Abrasive Size Distribution in CMP.- Material Removal Regions in CMP.- One and Semi-Two Dimensional Feature- and Die-Scale Modeling for the Damascene Process.- Three-Dimensional Feature-Scale Modeling of CMP.- Wafer-Scale Modeling of CMP.- Summary and Future work.
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Add Integrated Modeling of Chemical Mechanical Planarization for Sub-Micron IC Fabrication:: From Particle Scale to Feature, Die & Wafer Scales, This book is the product of a developing research focus on CMP at Berkeley. Its focus is on the important area of process models which have not kept pace with the tremendous expansion of applications of CMP. It specifically deals with the development of m, Integrated Modeling of Chemical Mechanical Planarization for Sub-Micron IC Fabrication:: From Particle Scale to Feature, Die and Wafer Scales to the inventory that you are selling on WonderClubX
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Add Integrated Modeling of Chemical Mechanical Planarization for Sub-Micron IC Fabrication:: From Particle Scale to Feature, Die & Wafer Scales, This book is the product of a developing research focus on CMP at Berkeley. Its focus is on the important area of process models which have not kept pace with the tremendous expansion of applications of CMP. It specifically deals with the development of m, Integrated Modeling of Chemical Mechanical Planarization for Sub-Micron IC Fabrication:: From Particle Scale to Feature, Die and Wafer Scales to your collection on WonderClub |