In-Line Characterization, Yield Reliability, and Failure Analyses in Microelectronic Manufacturing Book

Name: In-Line Characterization, Yield Reliability, and Failure Analyses
Brand: WonderClub
SKU: 9780819432230
Price: 121.49 USD
Availability: InStock
Rating: 4 (1 reviews)

In-Line Characterization, Yield Reliability, and Failure Analyses in Microelectronic Manufacturing, , In-Line Characterization, Yield Reliability, and Failure Analyses in Microelectronic Manufacturing

out of 5 stars based on 0 reviews

In-Line Characterization, Yield Reliability, and Failure Analyses in Microelectronic Manufacturing
Written by author Kostas Amberiadis, Gudrun Kissinger, Katsuya Okumura, Seshu V. Pabbisetty, Larg H. Weiland
Published by SPIE Press, 4/28/1999

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Title: In-Line Characterization, Yield Reliability, and Failure Analyses in Microelectronic Manufacturing

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WonderClub

Item Number: 9780819432230

Number: 1

Product Description: Full Name: In-Line Characterization, Yield Reliability, and Failure Analyses in Microelectronic Manufacturing; Short Name:In-Line Characterization

Universal Product Code (UPC): 9780819432230

WonderClub Stock Keeping Unit (WSKU): 9780819432230

Rating: 4/5 based on 1 Reviews

Image Location: https://wonderclub.com/images/covers/22/30/9780819432230.jpg

Category: Media >> Books

Weight: 0.200 kg (0.44 lbs)

Width: 0.000 cm (0.00 inches)

Heigh : 0.000 cm (0.00 inches)

Depth: 0.000 cm (0.00 inches)

Date Added: August 25, 2020, Added By: Ross

Date Last Edited: August 25, 2020, Edited By: Ross

Price	Condition	Delivery	Seller	Action
$121.49	Digital	Arrives between Apr 25 - May 25 Login to your account for a direct download. Some files are emailed from Dropbox. Continent $0.00 - World $0.00	WonderClub (9294 total ratings)

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