Analysis and Design of Integrated Circuits Book

	Symbol Convention
Ch. 1	Models for Integrated-Circuit Active Devices	1
1.1	Introduction	1
1.2	Depletion Region of a pn Junction	1
1.3	Large-Signal Behavior of Bipolar Transistors	10
1.4	Small-Signal Models of Bipolar Transistors	30
1.5	Large-Signal Behavior of Junction Field-Effect Transistors	46
1.6	Small-Signal Model of the JFET	55
1.7	Large-Signal Behavior of Metal-Oxide-Semiconductor Field-Effect Transistors	59
1.8	Small-Signal Model of the MOS Transistor in Saturation	67
1.9	Short-Channel Effects in FETs	72
1.10	Subthreshold Conduction in MOSFETs	76
1.11	Substrate Current Flow in MOSFETs	79
	Appendix A1.1 Summary of Active-Device Parameters	81
Ch. 2	BiPolar, MOS, and BiCMOS Integrated-Circuit Technology	89
2.1	Introduction	89
2.2	Basic Processes in Integrated-Circuit Fabrication	90
2.3	High-Voltage Bipolar Integrated-Circuit Fabrication	102
2.4	Advanced Bipolar Integrated-Circuit Fabrication	105
2.5	Active Devices in Bipolar Analog Integrated Circuits	111
2.6	Passive Components in Bipolar Integrated Circuits	133
2.7	Modifications to the Basic Bipolar Process	143
2.8	MOS Integrated-Circuit Fabrication	149
2.9	Active Devices in MOS Integrated Circuits	154
2.10	Passive Components in MOS Technology	167
2.11	BiCMOS Technology	172
2.12	Economics of Integrated-Circuit Fabrication	173
2.13	Packaging Considerations for Integrated Circuits	180
	Appendix A2.1 SPICE Model-Parameter Files	185
Ch. 3	Single-Transistor and Two-Transistor Amplifiers	193
3.1	Device Model Selection for Approximate Analysis of Analog Circuits	195
3.2	Basic Single-Transistor Amplifier Stages	196
3.3	Two-Transistor Amplifier Stages	219
3.4	Emitter-Coupled Pairs	227
3.5	Source-Coupled FET Pairs	244
3.6	Device Mismatch Effects in Differential Amplifiers	250
	Appendix A3.1 Elementary Statistics and the Gaussian Distribution	260
Ch. 4	Transistor Current Sources and Active Loads	269
4.1	Introduction	269
4.2	Current Sources	270
4.3	Current Sources as Active Loads	287
	Appendix A4.1 Matching Considerations in Transistor Current Sources	317
	Appendix A4.2 Supply-Independent Biasing	322
	Appendix A4.3 Temperature-Independent Biasing	333
	Appendix A4.4 Low-Current Biasing	346
Ch. 5	Output Stages	355
5.1	Introduction	355
5.2	The Emitter Follower as an Output Stage	355
5.3	The Common-Emitter Output Stage	370
5.4	The Common-Base Output Stage	377
5.5	Class B (Push-Pull) Output Stage	378
Ch. 6	Operational Amplifiers	409
6.1	Applications of Operational Amplifiers	410
6.2	Deviations from Ideality in Real Operational Amplifiers	420
6.3	Analysis of Monolithic Operational Amplifiers	425
6.4	Design Considerations in Monolithic Operational Amplifiers	445
6.5	MOS Operational Amplifiers	460
	Appendix A6.1 Calculation of the Input Offset Voltage and Current of the 741	466
	Appendix A6.2 Input Offset Voltage of MOS Op Amps	471
Ch. 7	Frequency Response of Integrated Circuits	479
7.1	Introduction	479
7.2	Single-Stage Amplifier Frequency Response	479
7.3	Multistage Amplifier Frequency Response	500
7.4	Analysis of the Frequency Response of the 741 Op Amp	519
7.5	Relation Between Frequency Response and Time Response	524
Ch. 8	Feedback	535
8.1	Ideal Feedback Equation	535
8.2	Gain Sensitivity	537
8.3	Effect of Negative Feedback on Distortion	538
8.4	Feedback Configurations	540
8.5	Practical Configurations and the Effect of Loading	547
8.6	Single-Stage Feedback	577
8.7	The Voltage Regulator as a Feedback Circuit	584
Ch. 9	Frequency Response and Stability of Feedback Amplifiers	597
9.1	Introduction	597
9.2	Relation Between Gain and Bandwidth in Feedback Amplifiers	597
9.3	Instability and the Nyquist Criterion	599
9.4	Compensation	607
9.5	Root-Locus Techniques	623
9.6	Slew Rate	642
Ch. 10	Nonlinear Analog Circuits